Measurement of semiconductor material: now 100,000 times more sensitive -- COMPAMED Trade Fair

Measurement of semiconductor material: now 100,000 times more sensitive

10.04.2019

Photo: Graphic of the microwave resonator; Copyright: Cockrell School of Engineering, The University of Texas at Austin

This is a rendering of the microwave resonator showing the (blue) microwave signal's size change resulting from a light pulse (red) once the pulse hits the infrared pixel (micrograph image of pixel is shown in the inset).

Products and exhibitors dealing with materials

Image: plastic tubes; Copyright: panthermedia.net/scanrail