Optimized technology for microelectronics -- COMPAMED Trade Fair

Optimized technology for microelectronics


Image: a grey structure reminiscent of rocks; Copyright: Denis Kosyanov, FEFU PI REC for Advanced Ceramic Materials Research

The most challenging thing turned out to be to determine the boundary parameters of the process where begins the chemical interaction of graphite impurities with the sintered material.

Products and exhibitors for research and development

Image: Laboratory technician in a white coat and glasses holding up a test tube - a blue graphic with chimical symbols and signs is laid over it; Copyright: PantherMedia / mikkolem